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Needs

ICs that are easy to test Increase accessiblity / observability Ensure predictable ICs response

Targets

Reduce test cost of complex ICs

Reduce test development time

Facilitate testing at system level

Improve product quality

Shorten time to market

Design for Testability

Design techniques that add certain testability features to a microelectronic hardware product design. The premise of the added features is that they make it easier to develop and apply manufacturing tests for the designed hardware. The development of test programs and the application of manufacturing tests are much easier if appropriate DfT rules and suggestions have been implemented.

Design for Assembly

Design techniques with ease of assembly in mind. If a product contains fewer parts or is provided with features which make it easier to grasp, move, orient and insert, it will reduce assembly time thereby reduce assembly costs.

Design for Manufacturability

Design techniques to modify the design of integrated circuits (IC), which are allowing ICs to be more manufacturable, i.e., to improve their functional yield, parametric yield, or their reliability.

More details

The purpose of manufacturing tests is to validate that the product hardware contains no defects that could, otherwise, adversely affect the product’s correct functionning. Tests are applied at several steps in the hardware manufacturing flow and, for certain product, may also be used for hardware maintenance in the customer’s environment. The tests  generally are driven by test programs that execute in Automatic Test Equipment (ATE) or, in the case of system maintenance, inside the assembled system itself. In addition to finding and indicating the presence of deffects (i.e., the test fails), tests may be able to log diagnostic information about the nature of the encountered test fails. The diagnostic information can be used to locate the source of the faiulre. DfT plays an important role in the development of test programs and as an interface for test applicaton and diagnostics.

More details

The reduction of the number of parts in an assembly has the added benefit of generally reducing the total cost of parts in the assembly. This is usually where the major cost benefits of the applicaiton of design for assembly to occur.

More details

The purpose of manufacturing tests is to validate that the product hardware contains no defects that could, otherwise, adversely affect the product’s correct functionning. Tests are applied at several steps in the hardware manufacturing flow and, for certain product, may also be used for hardware maintenance in the customer’s environment. The tests  generally are driven by test programs that execute in Automatic Test Equipment (ATE) or, in the case of system maintenance, inside the assembled system itself. In addition to finding and indicating the presence of deffects (i.e., the test fails), tests may be able to log diagnostic information about the nature of the encountered test fails. The diagnostic information can be used to locate the source of the faiulre. DfT plays an important role in the development of test programs and as an interface for test applicaton and diagnostics.

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